Effect of scattering on nonlinear optical scanning microscopy imaging of highly scattering media

Applied Optics

Volumn 39, Issue 4, 2000, Pages 509-514

  Ying, Jinpin ^a   Liu, Feng ^a   Alfano, Manuel ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042689447     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.000509     Document Type: Article

References (15)

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