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Volumn 67, Issue 4, 2000, Pages 177-181
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Methods to Measure Small Capacitances with High Resolution;Verfahren zur Messung kleiner Kapazitäten mit hoher Auflösung
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Author keywords
[No Author keywords available]
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Indexed keywords
ERROR MECHANISMS;
HIGH RESOLUTION;
MEASUREMENT METHODS;
MEASUREMENT TIME;
PARASITIC CAPACITANCE;
MEASUREMENT ERRORS;
CAPACITANCE;
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EID: 0042684732
PISSN: 01718096
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (7)
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