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Volumn 67, Issue 4, 2000, Pages 177-181

Methods to Measure Small Capacitances with High Resolution;Verfahren zur Messung kleiner Kapazitäten mit hoher Auflösung

Author keywords

[No Author keywords available]

Indexed keywords

ERROR MECHANISMS; HIGH RESOLUTION; MEASUREMENT METHODS; MEASUREMENT TIME; PARASITIC CAPACITANCE;

EID: 0042684732     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (7)
  • 2
    • 0027559840 scopus 로고
    • High-accuracy measurement techniques for capacitance transducers
    • Marioli, D.; Sardini, E.; Taroni, A.: High-accuracy measurement techniques for capacitance transducers. Meas. Sci. Technol. 4 (1993) 3, S. 337-343.
    • (1993) Meas. Sci. Technol. , vol.4 , Issue.3 , pp. 337-343
    • Marioli, D.1    Sardini, E.2    Taroni, A.3
  • 5
    • 0024068758 scopus 로고
    • A high frequency stray-immune capacitance transducer based on the charge transfer principle
    • Huang, S. M.; Green, R. G.; Plaskowski, A.; Beck, M. S.: A high frequency stray-immune capacitance transducer based on the charge transfer principle, IEEE Trans. Instrum. Meas. 37 (1988) 3, S. 368-373.
    • (1988) IEEE Trans. Instrum. Meas. , vol.37 , Issue.3 , pp. 368-373
    • Huang, S.M.1    Green, R.G.2    Plaskowski, A.3    Beck, M.S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.