Approximate sensitivity analysis for acyclic Markov reliability models

IEEE Transactions on Reliability

Volumn 52, Issue 2, 2003, Pages 220-230

  Ou, Yong ^a   Dugan, Joanne Bechta ^a  

^a University of Virginia   (United States)

Author keywords

Dynamic fault tree; Importance analysis; Markov chain; Sensitivity analysis

Indexed keywords

COMPUTER APPLICATIONS; FAILURE (MECHANICAL); FAULT TREE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; PROBABILITY; SENSITIVITY ANALYSIS;

ACYCLIC MARKOV RELIABILITY MODEL; DYNAMIC FAULT TREE; IMPORTANCE ANALYSIS;

RELIABILITY;

EID: 0042674276     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2003.809657     Document Type: Article

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