Experimental and modeling analysis of highly oriented octithiophene thin films

Synthetic Metals

Volumn 139, Issue 1, 2003, Pages 115-122

  Videlot, Christine ^a,b   Grayer, Valérie ^b   Ackermann, Jörg ^a   El Kassmi, Ahmed ^a   Fichou, Denis ^c,d   Hadziioannou, Georges ^b,e  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

^c CEA SACLAY   (France)

^d SORBONNE UNIVERSITÉ   (France)

^e UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

Molecular orientation; Morphology; Octithiophene; Structure; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; DEPOSITION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; LIGHT POLARIZATION; MOLECULAR ORIENTATION; MORPHOLOGY; OPTICAL MICROSCOPY; STRUCTURE (COMPOSITION); THIN FILMS; ULTRAVIOLET SPECTROSCOPY;

MECHANICAL RUBBING;

ORGANIC COMPOUNDS;

EID: 0042671327     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(03)00038-9     Document Type: Article

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