메뉴 건너뛰기




Volumn 209, Issue , 2003, Pages 335-339

Ion beam photography in sol-gel NiO-SiO2 films

Author keywords

Irradiation; Nanoclusters; Nickel; NiO; SiO2; Sol gel

Indexed keywords

ANNEALING; ARGON; COATING TECHNIQUES; COMPOSITE MATERIALS; ION BEAMS; LOW TEMPERATURE EFFECTS; MULTILAYERS; NANOSTRUCTURED MATERIALS; NITROGEN OXIDES; NUCLEATION; SILICA; SILICON WAFERS; SOL-GELS; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0042661049     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)02018-9     Document Type: Conference Paper
Times cited : (7)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.