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Volumn 209, Issue , 2003, Pages 335-339
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Ion beam photography in sol-gel NiO-SiO2 films
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Author keywords
Irradiation; Nanoclusters; Nickel; NiO; SiO2; Sol gel
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Indexed keywords
ANNEALING;
ARGON;
COATING TECHNIQUES;
COMPOSITE MATERIALS;
ION BEAMS;
LOW TEMPERATURE EFFECTS;
MULTILAYERS;
NANOSTRUCTURED MATERIALS;
NITROGEN OXIDES;
NUCLEATION;
SILICA;
SILICON WAFERS;
SOL-GELS;
STOICHIOMETRY;
TRANSMISSION ELECTRON MICROSCOPY;
ION BEAM PHOTOGRAPHY;
SEMICONDUCTING FILMS;
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EID: 0042661049
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)02018-9 Document Type: Conference Paper |
Times cited : (7)
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References (13)
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