Quantitative texture measurements of YBCO films on various substrates

Materials Science and Engineering: A

Volumn 205, Issue 1-2, 1996, Pages 9-22

  Wenk, H R ^a,b   Chakhmovradian, A ^a   Foltyn, S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Epitaxy; Texture measurement; YBa2Cu3O7 films

Indexed keywords

CHARACTERIZATION; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; LASER ABLATION; OXIDE SUPERCONDUCTORS; PHASE TRANSITIONS; SPATIAL VARIABLES MEASUREMENT; SUBSTRATES; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; YTTRIUM COMPOUNDS;

CRYSTALLINITY; DEPOSITION TEMPERATURE; TEXTURE MEASUREMENT; X RAY LAUE PATTERNS; X RAY POLE FIGURE MEASUREMENTS; X RAY TEXTURE ANALYSIS; YTTRIUM BARIUM CUPRATES;

SUPERCONDUCTING FILMS;

EID: 0042627663     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5093(95)09862-3     Document Type: Article

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