Precise measurement of the lattice parameters of α-Al2O3 in the temperature range 4.5-250 K using the Mössbauer wavelength standard

Journal of Applied Crystallography

Volumn 36, Issue 4, 2003, Pages 1075-1081

  Lucht, M ^a   Lerche, M ^a   Wille, H C ^a   Shvyd'Ko, Yu V ^a   Ruter H D ^a   Gerdau, E ^a   Becker, P ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE;

ARTICLE; CRYSTAL STRUCTURE; DIAGNOSTIC ACCURACY; MEASUREMENT; MOSSBAUER SPECTROSCOPY; RADIATION SCATTERING; TEMPERATURE DEPENDENCE; THERMAL CONDUCTIVITY; X RAY ANALYSIS;

EID: 0042626327     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803011051     Document Type: Article

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