Measurement of two-dimensional birefringence distribution for laser materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2873, Issue , 1996, Pages 160-163

  Otani, Yukitoshi ^a   Yoshizawa, Torn ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

POLARIZATION;

AZIMUTHAL ANGLE; BIREFRINGENCE DISTRIBUTION; BIREFRINGENCE MEASUREMENTS; LASER MATERIALS; MANUFACTURING PROCESS; MINIMUM DETECTABLE LIMITS; PHASE-SHIFTING TECHNIQUE; POINT MEASUREMENT;

BIREFRINGENCE;

EID: 0042606041     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.246207     Document Type: Conference Paper

References (4)

1. Y. Otani, T. Shimada, T. Yoshizawa, N. Umeda: Proc. SPIE 1720 (1992) 346-354.
2. Y. Otani, T. Shimada, N. Umeda, T. Yoshizawa: Opt. Eng. 33, 5, 1604-1609, (1994).
3. N. Umeda and H. Kohwa: Electronics and Communications in Japan, part 2, 74(5), 21-28, (1991).
4. Y. Otani, T. Shimada, T. Yoshizawa: Optical Review, 1, 1 (1994) 103-106.