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Volumn 63, Issue 4, 1996, Pages 136-141
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Confocal laser scanning microscopy for optical measurement of the microstructure of surfaces and layers;Konfokale Laserscan-Mikroskopie zur optischen Vermessung der Mikrotopographie von Oberflächen und Schichten
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0042585476
PISSN: 01718096
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (7)
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