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Volumn 75, Issue 24, 1999, Pages 3829-3831

Imaging near-contact transport in the planar-collector geometry for a Schottky contact on high-purity GaAs

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Indexed keywords


EID: 0042546294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125470     Document Type: Article
Times cited : (4)

References (16)
  • 1
    • 77956986329 scopus 로고
    • edited by T. E. Schlesinger and R. B. James Academic, New York
    • D. S. McGregor and J. E. Kammeraad, in Semiconductors and Semimetals. edited by T. E. Schlesinger and R. B. James (Academic, New York, 1995), Vol. 43, p. 383.
    • (1995) Semiconductors and Semimetals , vol.43 , pp. 383
    • McGregor, D.S.1    Kammeraad, J.E.2
  • 9
    • 0002887012 scopus 로고
    • edited by D. Holt and D. Joy Academic, New York, Chap. 6
    • D. B. Holt, in SEM Microcharacterization of Semiconductors, edited by D. Holt and D. Joy (Academic, New York, 1989), Chap. 6, pp. 241-338.
    • (1989) SEM Microcharacterization of Semiconductors , pp. 241-338
    • Holt, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.