Studies of ionizing radiation effects on silicon drift detectors

Nuclear Inst. and Methods in Physics Research, A

Volumn 361, Issue 3, 1995, Pages 457-460

  Pandey, S U ^a   Vilkelis, G ^a   Humanic, T J ^a   Kraner, H ^b   Bellwied, R ^c   French, A ^c   Hall, J ^c  

^a OHIO STATE UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042542159     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)00196-4     Document Type: Article

References (5)