Electroabsorption field imaging between coplanar metal contacts on semi-insulating semiconductor epilayers

Applied Physics Letters

Volumn 68, Issue 1, 1996, Pages 72-74

  Nolte, D D ^a   Chen, N P ^a   Melloch, M R ^a   Montemagno, C ^b   Haegel, N M ^c  

^a PURDUE UNIVERSITY   (United States)

^b Department of Obstetrics Gynecology   (United States)

^c FAIRFIELD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042527147     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116761     Document Type: Article

References (14)

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