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Volumn 44, Issue 21, 1999, Pages 3761-3768
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Trace metal determination by dc resistance changes of microstructured thin gold film electrodes
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Author keywords
[No Author keywords available]
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Indexed keywords
CADMIUM;
ELECTRIC RESISTANCE MEASUREMENT;
ELECTRODEPOSITION;
ELECTRODES;
GOLD;
IONS;
LEAD;
NICKEL;
SURFACE PHENOMENA;
THALLIUM;
THIN FILMS;
ZINC;
ADATOMS;
SILICON TECHNOLOGY;
STRIPPING METHOD;
SURFACE RESISTANCE;
THIN GOLD FILM ELECTRODE;
TRACE METAL DETERMINATION;
HEAVY METALS;
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EID: 0042518821
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(99)00081-X Document Type: Article |
Times cited : (16)
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References (23)
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