Characterization of refractive index changes of silica glass induced by ion microbeam

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 210, Issue , 2003, Pages 272-276

  Hattori, M ^a   Ohki, Y ^a   Fujimaki, M ^b   Souno, T ^c   Nishikawa, H ^c   Watanabe, E ^d   Oikawa, M ^e   Kamiya, T ^e   Arakawa, K ^e  

^a WASEDA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c SHIBAURA INSTITUTE OF TECHNOLOGY   (Japan)

^d TOKYO METROPOLITAN UNIVERSITY   (Japan)

^e JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Atomic force microscope; Compaction; Ion microbeam; Refractive index change; Silica glass

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION BEAMS; ION BOMBARDMENT; OPTICAL MICROSCOPY; REFRACTIVE INDEX;

INTERNAL COMPACTION;

FUSED SILICA;

EID: 0042513863     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01030-9     Document Type: Conference Paper

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