Crystal growth and spectroscopic properties of Er:La3Ga 5SiO14 single crystals

Journal of Crystal Growth

Volumn 257, Issue 1-2, 2003, Pages 141-145

  Wang, Zengmei ^a   Yuan, Duorong ^a   Shi, Xuzhong ^a   Cheng, Xiufeng ^a   Xu, Dong ^a   Lv, Mengkai ^a   Pan, Lihu ^b   Guo, Shiyi ^a  

^a SHANDONG UNIVERSITY   (China)

^b Beijing Inst Radio Metrol/Msrmt   (China)

Author keywords

A1. X ray diffraction; A2. Czochralski method; B1. Gallium compounds; B2. Piezoelectric materials; B3. Solid state lasers

Indexed keywords

CRYSTAL GROWTH FROM MELT; CRYSTAL STRUCTURE; DOPING (ADDITIVES); ERBIUM; GALLIUM COMPOUNDS; LANTHANUM COMPOUNDS; PIEZOELECTRIC MATERIALS; SOLID STATE LASERS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

X-RAY FLUORESCENCE (XRF) ANALYSIS;

SINGLE CRYSTALS;

EID: 0042510550     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01411-8     Document Type: Article

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