Characterization of Si-CeO2-YBCO tri-layers grown by magnetron sputtering

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 2860-2863

  Chiodoni, A ^a   Andreone, D ^b   Botta, D ^a   Camerlingo, C ^c   Fabbri, F ^d   Gerbaldo, R ^a   Ghigo, G ^a   Gozzelino, L ^a   Laviano, F ^a   Minetti, B ^a   Pirri, C F ^a   Tallarida, G ^e   Tresso, E ^a   Mezzetti, E ^a  

^a POLITECNICO DI TORINO   (Italy)

^b ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

^c CNR   (Italy)

^d ENEA   (Italy)

^e LABORATORIO MDM   (Italy)

Author keywords

Buffer layers; Integrated electronics; Semiconducting superconducting interfaces; Superconducting YBCO films

Indexed keywords

EPITAXIAL GROWTH; MAGNETRON SPUTTERING; SILICON COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0042476331     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812042     Document Type: Conference Paper

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