Hamiltonian plasma-harmonic oscillator theory: Generalized depth profilometry of electronically continuously inhomogeneous semiconductors and the inverse problem

Journal of Applied Physics

Volumn 80, Issue 9, 1996, Pages 5278-5288

  Salnick, Alex ^a   Mandelis, Andreas ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042458917     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363515     Document Type: Article

References (19)

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