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Volumn 1996-U, Issue , 1996, Pages 93-98
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GIANT REDUCTION IN LATERAL THERMAL CONDUCTIVITY OF THIN NITRIDE/SILICON/OXIDE MEMBRANE MEASURED WITH A SUSPENDED MICRO STRUCTURE
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
EQUIVALENT CIRCUITS;
MEMBRANES;
MICROSTRUCTURE;
MONOCRYSTALLINE SILICON;
SILICON NITRIDE;
% REDUCTIONS;
ACCURATE MEASUREMENT;
DIRECT MEASUREMENT;
MEASUREMENTS OF;
MEMBRANE MATERIAL;
MICRO-STRUCTURES;
MULTILAYER MEMBRANES;
OXIDE MEMBRANE;
THERMAL BRIDGE;
THERMAL ELEMENTS;
SILICON OXIDES;
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EID: 0042428126
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/IMECE1996-1341 Document Type: Conference Paper |
Times cited : (3)
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References (5)
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