Strain-induced birefringence in Si1-xGex optical waveguides

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 1773-1776

  Robillard, M ^a,d   Jessop, P E ^a   Bruce, D M ^a   Janz, S ^b   Williams, R L ^b   Mailhot, S ^b   Lafontaine, H ^b   Kovacic, S J ^c,e   Ojha, J J ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c NORTEL NETWORKS   (Canada)

^d Newbridge Networks Corp   (Canada)

^e SiGe Microsystems   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042424062     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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