Kinetics of surface growth: Phenomenology, scaling, and mechanisms of smoothening and roughening

Annual Review of Physical Chemistry

Volumn 45, Issue 1, 1994, Pages 401-438

  Tong, William M ^a   Williams, R Stanley ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Deposition; Etching; Morphology; Topography

Indexed keywords

EID: 0042407342     PISSN: 0066426X     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.pc.45.100194.002153     Document Type: Article

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