|
Volumn 801 LNCS, Issue , 1994, Pages 173-178
|
Lack-of-fit detection using the run-distribution test
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ARTIFICIAL INTELLIGENCE;
COMPUTER SCIENCE;
COMPUTERS;
CLASS OF DISTRIBUTIONS;
FEATURE-TRACKING;
LACK-OF-FIT;
NOISE LEVELS;
PARAMETRIC MODELING;
RUN DISTRIBUTION;
SENSOR NOISE LEVEL;
VISION COMMUNITIES;
COMPUTER VISION;
|
EID: 0042407071
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/bfb0028348 Document Type: Conference Paper |
Times cited : (3)
|
References (11)
|