Diffraction and line shape of Fourier-transform spectrometers

Applied Optics

Volumn 42, Issue 22, 2003, Pages 4541-4548

  Genest, Jérôme ^a,b   Tremblay, Pierre ^a  

^a UNIVERSITÉ LAVAL   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE OPTICS; ELECTROMAGNETIC WAVE DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFEROMETERS; RADIOMETRY;

LINE SHAPE MODELS;

SPECTROMETERS;

EID: 0042381919     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.004541     Document Type: Article

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