메뉴 건너뛰기




Volumn 42, Issue 6 A, 2003, Pages 3702-3706

Deep dry etching of quartz plate over 100 μm in depth employing ultra-thick photoresist (SU-8)

Author keywords

Deep etching; Defect; Etch rate variation; Instability; Quartz; SU 8

Indexed keywords

CLEANING; ETCHING; INDUCTIVELY COUPLED PLASMA; PHOTORESISTS; PLATE METAL; SCANNING ELECTRON MICROSCOPY;

EID: 0042381533     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.3702     Document Type: Article
Times cited : (7)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.