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Volumn 5030 II, Issue , 2003, Pages 788-798

Electronic readout of a-Si EPIDs for optimum signal to noise ratio

Author keywords

Cone Beam CT; Electronic portal imaging device; EPID electronic readout; Flat Panel Detectors

Indexed keywords

FLAT PANEL DETECTORS;

EID: 0042376201     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.480481     Document Type: Conference Paper
Times cited : (3)

References (5)
  • 2
  • 3
    • 84889168660 scopus 로고    scopus 로고
    • Perkin Elmer Optoelectronics, Radiation Image detector RID 1640, version 3
    • Perkin Elmer Optoelectronics, Radiation Image detector RID 1640, version 3. Perkin Elmer Optoelectronics, Radiation Image detector RID 1640, version 3.
    • Radiation Image Detector RID 1640, Version 3
  • 4
    • 0029900134 scopus 로고    scopus 로고
    • A quality control test for electronic portal imaging devices
    • R. Rajapakshe, K. Luchka, and S. Shalev, A quality control test for electronic portal imaging devices, Med. Phys. 23 (7) 1237-1244, 1996.
    • (1996) Med. Phys. , vol.23 , Issue.7 , pp. 1237-1244
    • Rajapakshe, R.1    Luchka, K.2    Shalev, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.