Registration temperature effect on sensitivity of CR-39(DOP) and SR-90 polymer track detectors

Radiation Measurements

Volumn 36, Issue 1-6 SPEC., 2003, Pages 89-92

  Diwan, P K ^a   Sharma, Vishal ^a   Sharma, S K ^b   Kumar, Shyam ^a  

^a KURUKSHETRA UNIVERSITY   (India)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

CR 39(DOP); Etching; Registration temperature; Sensitivity; SR 90

Indexed keywords

ETCHING; IRRADIATION; RADIATION DETECTORS; THERMAL EFFECTS;

POLYMER TRACK DETECTORS;

NUCLEAR PHYSICS;

EID: 0042364929     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00100-8     Document Type: Conference Paper

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