SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Electron Spectroscopy and Related Phenomena

Volumn 76, Issue C, 1995, Pages 313-318

Total reflection X-ray photoelectron spectroscopy

(5) Kawai, Jun a Hayakawa, Shinjiro b Kitajima, Yoshinori c Maeda, Kuniko d Gohshi, Yohichi b

a KYOTO UNIVERSITY (Japan)

b UNIVERSITY OF TOKYO (Japan)

c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK (Japan)

d INST OF PHYS AND CHEMICAL RESEARCH (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042356504 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(95)02518-9 Document Type: Article

Times cited : (32)

References (16)

1
- 26144449160
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt¹

2
- 0002201758
- (1972) Phys. Rev. , vol.6 A , pp. 94
- Henke¹

3
- 0004121510
- (1977) Chem. Phys. Lett. , vol.46 , pp. 225
- Mehta¹ Fadley²

4
- 0005217408
- (1975) Phys. Lett. , vol.55 A , pp. 59
- Mehta¹ Fadley²

5
- 0000247013
- Grazing-incidence x-ray photoemission spectroscopy investigation of oxidized GaAs(100): A novel approach to nondestructive depth profiling
- (1993) Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures , vol.11 B , pp. 1609
- Chester¹ Jach² Thurgate³

6
- 0003977237
- (1993) Phys. Rev. , vol.48 B , pp. 17262
- Chester¹ Jach²

7
- 0028368598
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 339
- Jach¹ Chester² Thurgate³

8
- 4243324225
- (1994) Nucl. Instrum. Methods Phys. Res. , vol.347 A , pp. 507
- Jach¹ Chester² Thurgate³

9
- 0026886511
- (1992) Spectrochim. Acta , vol.47 B , pp. 983
- Kawai¹ Takami² Fujinami³ Hashiguchi⁴ Hayakawa⁵ Gohshi⁶

10
- 0022063507
- (1986) Nucl. Instrum. Methods Phys. Res. , vol.246 A , pp. 373
- Ohta¹ Stefan² Nomura³ Sekiyama⁴

11
- 0000610869
- (1989) Rev. Sci. Instrum. , vol.60 , pp. 2505
- Funabashi¹ Nomura² Kitajima³ Yokoyama⁴ Ohta⁵ Kuroda⁶

12
- 0345649223
- (1992) Journal of Science of the Hiroshima University , vol.56 A , pp. 1
- Takata¹

13
- 0041689190
- (1993) Appl. Phys. Lett. , vol.63 , pp. 269
- Kawai¹ Hayakawa² Suzuki³ Kitajima⁴ Takata⁵ Urai⁶ Maeda⁷ Fujinami⁸ Hashiguchi⁹ Gohshi¹⁰

14
- 51149205603
- (1993) Appl. Phys. Lett. , vol.63 , pp. 3238
- Kawai¹ Hayakawa² Suzuki³ Kitajima⁴ Takata⁵ Urai⁶ Maeda⁷ Fujinami⁸ Hashiguchi⁹ Gohshi¹⁰

15
- 85008071083
- Surface Sensitive X-ray Absorption Fine Structure Measurement Using Sample Current Induced by Totally Reflected X-rays.
- (1993) Proceedings of the Japan Academy. Ser. B: Physical and Biological Sciences , vol.69 B , pp. 179
- Kawai¹ Hayakawa² Kitajima³ Suzuki⁴ Maeda⁵ Urai⁶ Adachi⁷ Takami⁸ Gohshi⁹

16
- 0004932883
- (1993) Atom. Data Nucl. Data Tables , vol.54 , pp. 181
- Henke¹ Gullikson² Davis³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.