Fundamental studies of the sampling process in an inductively coupled plasma-mass spectrometer Part IV.-Replacement of the inductively coupled plasma with a helium microwave-induced plasma

Spectrochimica Acta Part B: Atomic Spectroscopy

Volumn 46, Issue 13, 1991, Pages 1745-1765

  Chambers, D M ^a   Carnahan, J W ^a   Jin, Q ^a   Hieftje, G M ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042335743     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/0584-8547(91)80178-6     Document Type: Article

References (46)

1. Helium-Chlorine Charge Transfer: An Explanation for Chlorine Ion Emission Behavior in Helium Discharges
2. Reduced-pressure microwave-induced plasma mass spectrometric detection of phosphorus and sulphur in gas chromatographic eluates
3. 1988 Pittsburgh Conference and Exposition, New Orleans, Louisiana
4. Plasma sampling - a versatile tool in plasma chemistry
5. A new sensitive molecular beam mass spectrometer
6. Molecular Beams with Energies above One Electron Volt
7. Ion Kinetic Energies in Inductively Coupled Plasma/Mass Spectrometry (ICP-MS)