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Volumn 592, Issue 1 I, 2003, Pages 636-643
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Assessment of the fluorescence and auger database used in plasma modeling
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Author keywords
Atomic data; Atomic processes; Line: formation; X rays: general
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Indexed keywords
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EID: 0042333476
PISSN: 0004637X
EISSN: 15384357
Source Type: Journal
DOI: 10.1086/375561 Document Type: Article |
Times cited : (33)
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References (19)
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