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Volumn 174-175, Issue , 2003, Pages 770-773

Deposition technology of a new nanostructured material for reversible charge storage

Author keywords

AFM; Carbon; Germanium; Nanostructure; PACVD

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

EID: 0042328069     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00570-X     Document Type: Article
Times cited : (8)

References (15)
  • 5
  • 7
    • 3342910942 scopus 로고
    • Scanning capacitance detection and charge trapping in NOS
    • Terris B.D. Barrett R.C. Mamin H.J. Scanning capacitance detection and charge trapping in NOS SPIE 1855 1993 194
    • (1993) SPIE , vol.1855 , pp. 194
    • Terris, B.D.1    Barrett, R.C.2    Mamin, H.J.3
  • 8
    • 0029305424 scopus 로고
    • Data storage in NOS: Lifetime and carrier-to-noise measurements
    • B.D. Terris, R.C. Barrett, Data storage in NOS: lifetime and carrier-to-noise measurements in IEEE Trans. Elect. Dev., 1995
    • (1995) IEEE Trans. Elect. Dev.
    • Terris, B.D.1    Barrett, R.C.2
  • 11
    • 0042352644 scopus 로고
    • B. R. Mathieu, D. Briggs (Eds.), Chichester, U.K., Montreux, Switzerland: Wiley
    • Kazimierski P. Lehmberg H. Mathieu B.R.H.J. Briggs D. ECASIA'95 1995 403 Wiley Chichester, U.K., Montreux, Switzerland
    • (1995) ECASIA'95 , pp. 403
    • Kazimierski, P.1    Lehmberg, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.