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Volumn 326-327, Issue , 2003, Pages 484-488
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Surface deformations and amplitude-phase recording in chalcogenide nanolayered structures
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ARSENIC COMPOUNDS;
DEFORMATION;
LASER BEAMS;
LIGHT SENSITIVE MATERIALS;
MODULATION;
MULTILAYERS;
OPTICAL RECORDING;
SURFACE DEFORMATIONS;
NANOSTRUCTURED MATERIALS;
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EID: 0042327992
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(03)00457-5 Document Type: Conference Paper |
Times cited : (22)
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References (12)
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