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Volumn 326-327, Issue , 2003, Pages 484-488

Surface deformations and amplitude-phase recording in chalcogenide nanolayered structures

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ARSENIC COMPOUNDS; DEFORMATION; LASER BEAMS; LIGHT SENSITIVE MATERIALS; MODULATION; MULTILAYERS; OPTICAL RECORDING;

EID: 0042327992     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00457-5     Document Type: Conference Paper
Times cited : (22)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.