XPS analysis of the cerium conversion coating on the anodized Al6061/SiCp

Journal of Materials Science and Technology

Volumn 19, Issue 2, 2003, Pages 157-160

  Yu, Xingwen ^a   Yan, Chuanwei ^b   Cao, Chunan ^b   Li, Guoqiang ^c  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b INSTITUTE OF METAL RESEARCH   (China)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Al6061 SiCp; Anodization; Ce rich conversion coating; X ray photoelectron spectroscopy

Indexed keywords

CHROMATES; COATINGS; CONCENTRATION (PROCESS); SPECTROSCOPY;

ANODIZATION; CERIUM RICH CONVERSION COATING; METAL MATRIX COMPOSITES; X RAY PHOTOELECTRON SPECTROSCOPY;

CERIUM;

EID: 0042320364     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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