Detailed compositional analysis of naphtha and reformate by near-infrared spectroscopy

American Laboratory

Volumn 31, Issue 23, 1999, Pages 24-25

  Chung, Hoeil ^a   Lee, Joon Sik ^a   Ku, Min Sik ^a  

^a SK Corporation   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042308069     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (12)

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12. Chung H, Lee JS, Ku MS. Feasibility of simultaneous measurement of xylene isomers and other hydrocarbons in p-xylene production processes using near-infrared spectroscopy. Appl Spec 1988; 52(6):885-9.