The Impact of Substrate Roughness on Porosity: A Comparison of Electroplated Palladium, Palladium-Nickel & Cobalt Hard Gold

Plating and Surface Finishing

Volumn 84, Issue 1, 1997, Pages 32-37

  Kudrak, E J ^a   Abys, J A ^a   Humiec, F ^a,b,c  

^a NOKIA RESEARCH CENTER   (United States)

^b NIAGARA UNIVERSITY   (United States)

^c FAIRLEIGH DICKINSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; ELECTRODES; GOLD; NICKEL; PALLADIUM; POROSITY; SUBSTRATES; SURFACE ROUGHNESS;

COBALT HARD GOLD; ROTATING DISK ELECTRODE; SUBSTRATE ROUGHNESS;

ELECTROPLATING;

EID: 0042305964     PISSN: 03603164     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (16)

1. M. Clarke, Properties of Electrodeposits - Their Measurement and Significance, R. Sard, Ed., The Electrochemical Society Inc., Princeton, NJ, 1975; pp. 122-141.
2. E.J. Kudrak and J.A. Abys, AESF SUR/FIN '92, Session M, Atlanta, GA., 1992.
3. R.A. Ehrhardt, Tech. Proc. Amer. Electroplaters Soc., 47, 78 (1960).
4. H. Noonan, Plating, 53, 461 (April 1966).
5. S.M. Garte, ibid., 53, 1335 (Nov. 1966).
6. AuRoTech Gold Plating Chemistries, AT&T Nassau Metals, Staten Island, NY.
7. PallaTech Palladium and Palladium Alloy Plating Chemistries, AT&T Nassau Metals, Staten Island, NY.
8. J.A. Abys, Internal publication, June 10, 1982.
9. E.J. Kudrak and J.A. Abys, Proc. Twenty-Fifth Annual Conn. and Interconn. Tech. Symp., San Jose, CA. (Oct. 1992).
10. Standard Test Method for Porosity of Gold and Palladium Coatings by Sulfurous Acid/Vapor, ASTM B799-88, Amer. Soc. for Testing and Materials, Philadelphia, PA, 1988.
11. E.J. Kudrak, et al., Plat. and Surf. Fin., 79, 49 (Feb. 1992).
12. A.H. Graham, M.J. Pike-Biegunski and S.W. Updegraff, Proc. Second AES Symp. on Econ. Use and Subst. for Prec. Metals in the Elec. Ind., Danvers, MA, Oct. 1982.
13. K.J. Whitlaw, Proc. AES Tenth Symp. on Plating in the Electronics Industry, San Francisco, CA (Feb. 1983).
14. J.L. Chao and R.R. Gore, Proc. 78th Annual AESF Tech. Conf. (SUR/FIN '91, Session I), Toronto, Ont.
15. M.R. Turpin, M.K. Testerman and R.D. Hartman, J. Appl. Physics, 34, 1492 (1963).
16. S.M. Garte, Plating, 55, 946 (Sept. 1968).