A new method to measure the average lifetime of transient chaos

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 254, Issue 3-4, 1999, Pages 165-169

  Yin, Hua Wei ^a   Dai, Jian Hua ^a   Zhang, Hong Jun ^a,b  

^a INSTITUTE OF PHYSICS   (China)

^b CCAST WORLD LABORATORY   (China)

Author keywords

Average lifetime; Transient chaos

Indexed keywords

CHAOS THEORY;

AVERAGE LIFETIME; BOUNDARY CRISIS; CHAOTIC ATTRACTORS; CHAOTIC TRANSIENTS; CRITICAL EXPONENT; NUMERICAL EXPERIMENTS; TRANSIENT CHAOS;

NUMERICAL METHODS;

EID: 0042279934     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(99)00112-7     Document Type: Article

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