Details of the measurement of rare earth and other trace element abundances by secondary ion mass spectrometry

International Journal of Mass Spectrometry

Volumn 176, Issue 1-2, 1998, Pages 63-76

  Fahey, A J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Quantitative secondary ion mass spectrometry; Rare earth elements

Indexed keywords

EID: 0042264086     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1387-3806(98)14006-x     Document Type: Article

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