Towards the calibration of the HETGS line response function

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 160-171

  Marshall, H L ^a   Dewey, D ^a   Flanagan, K A ^a   Baluta, C ^a   Canizares, C R ^a   Davis, D S ^a   Davis, J E ^a   Fang, T T ^a   Huenemoerder, D P ^a   Kastner, J H ^a   Schulz, N S ^a   Wise, M W ^a   Drake, J J ^a   Juda, J Z ^a   Juda, M ^a   Brinkman, A C ^a   Gunsing, C J Th ^a   Kaastra, J ^a   Hartner, G ^a   Predehl, P ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

AXAF; Calibration; Diffraction; Grating; Scattering; X ray

Indexed keywords

CALIBRATION; LIGHT SCATTERING; OPTICAL RESOLVING POWER; SPECTROMETERS; X RAY OPTICS;

HIGH EMISSION TRANSMISSION GRATING SPECTROMETERS (HETGS); LINE RESPONSE FUNCTIONS (LRF);

DIFFRACTION GRATINGS;

EID: 0042257241     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278844     Document Type: Conference Paper

References (9)

1. The high energy transmission grating spectrometer for AXAF
2. The high energy transmission grating spectrometer for AXAF
3. Laboratory calibration of x-ray transmission diffraction gratings
4. Transmission x-ray diffraction grating alignment using a photoelastic modulator