Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method

European Physical Journal B

Volumn 28, Issue 1, 2002, Pages 45-48

  Cai, Jun ^a,c   Wang, Jian Sheng ^b,c  

^a INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c SINGAPORE MIT ALLIANCE   (Singapore)

Author keywords

61.72.Nn stacking faults and other planar or extended defects; 71.15.Nc Total energy and cohesive energy calculations

Indexed keywords

EID: 0042233987     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2002-00197-6     Document Type: Article

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