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Volumn 27, Issue 3, 1999, Pages 349-362

Control of complex manufacturing processes: A comparison of SPC methods with a radial basis function neural network

Author keywords

Multivariate; Neural networks; Process control; Time series

Indexed keywords


EID: 0042230462     PISSN: 03050483     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0305-0483(98)00053-X     Document Type: Article
Times cited : (11)

References (18)
  • 1
    • 0003110407 scopus 로고
    • Time-series investigation of subsample mean charts
    • Alwan L.C., Radson D. Time-series investigation of subsample mean charts. IIE Transactions. 24(5):1992;66-80.
    • (1992) IIE Transactions , vol.24 , Issue.5 , pp. 66-80
    • Alwan, L.C.1    Radson, D.2
  • 3
    • 0000002118 scopus 로고
    • Some statistical process control methods for auto-correlated data
    • Montgomery D.C., Mastrangelo C.M. Some statistical process control methods for auto-correlated data. Journal of Quality Technology. 23(3):1991;179-204.
    • (1991) Journal of Quality Technology , vol.23 , Issue.3 , pp. 179-204
    • Montgomery, D.C.1    Mastrangelo, C.M.2
  • 4
    • 0028533024 scopus 로고
    • Analysis of auto-correlation in dynamic processes
    • Zhang N.F., Pollard J.F. Analysis of auto-correlation in dynamic processes. Technometrics. 36(4):1994;354-368.
    • (1994) Technometrics , vol.36 , Issue.4 , pp. 354-368
    • Zhang, N.F.1    Pollard, J.F.2
  • 5
    • 84893529721 scopus 로고
    • Statistical process monitoring and feedback adjustment: A discussion
    • Box G., Kramer T. Statistical process monitoring and feedback adjustment: a discussion. Technometrics. 34(3):1992;251-267.
    • (1992) Technometrics , vol.34 , Issue.3 , pp. 251-267
    • Box, G.1    Kramer, T.2
  • 7
    • 77955331694 scopus 로고
    • A multivariate exponentially weighted moving average control chart
    • Lowry C.A., Woodall W.H., Champ C.W., Rigdon S.E. A multivariate exponentially weighted moving average control chart. Technometrics. 34(1):1992;46-53.
    • (1992) Technometrics , vol.34 , Issue.1 , pp. 46-53
    • Lowry, C.A.1    Woodall, W.H.2    Champ, C.W.3    Rigdon, S.E.4
  • 8
    • 0029252734 scopus 로고
    • Multivariate SPC charts for monitoring batch processes
    • Nomikos P., MacGregor J.F. Multivariate SPC charts for monitoring batch processes. Technometrics. 37(1):1995;41-59.
    • (1995) Technometrics , vol.37 , Issue.1 , pp. 41-59
    • Nomikos, P.1    MacGregor, J.F.2
  • 9
    • 0002298590 scopus 로고
    • Modifications of control chart limits in the presence of data correlation
    • Vasilopoulos A.V., Stamboulis A.P. Modifications of control chart limits in the presence of data correlation. Journal of Quality Technology. 10:1978;20-30.
    • (1978) Journal of Quality Technology , vol.10 , pp. 20-30
    • Vasilopoulos, A.V.1    Stamboulis, A.P.2
  • 13
    • 0000669122 scopus 로고
    • The exponentially weighted moving average
    • Hunter J.S. The exponentially weighted moving average. Journal of Quality Technology. 18(4):1986;203-209.
    • (1986) Journal of Quality Technology , vol.18 , Issue.4 , pp. 203-209
    • Hunter, J.S.1
  • 14
    • 0029196273 scopus 로고
    • A multi-layer neural network model for detecting changes in the process mean
    • Cheng-Sheng C. A multi-layer neural network model for detecting changes in the process mean. Computers in Industrial Engineering. 28(1):1995;51-61.
    • (1995) Computers in Industrial Engineering , vol.28 , Issue.1 , pp. 51-61
    • Cheng-Sheng, C.1
  • 15
    • 0041680926 scopus 로고
    • Neural network aided fault diagnosis of supervisory control of advanced manufacturing systems
    • Ye N., Zhao B., Salvendy G. Neural network aided fault diagnosis of supervisory control of advanced manufacturing systems. International Journal of Advanced Manufacturing Technology. 8(4):1993;200-209.
    • (1993) International Journal of Advanced Manufacturing Technology , vol.8 , Issue.4 , pp. 200-209
    • Ye, N.1    Zhao, B.2    Salvendy, G.3
  • 16
    • 0026135904 scopus 로고
    • Using radial basis functions for classifying process faults
    • Leonard J.A., Kramer M.A. Using radial basis functions for classifying process faults. IEEE Control Systems. 11(3):1991;31-38.
    • (1991) IEEE Control Systems , vol.11 , Issue.3 , pp. 31-38
    • Leonard, J.A.1    Kramer, M.A.2
  • 18
    • 84953122460 scopus 로고
    • Shewhart-type charts in nonstandard situations
    • Roes K.C.B., Does R.J.M.M. Shewhart-type charts in nonstandard situations. Technometrics. 37(1):1995;15-40.
    • (1995) Technometrics , vol.37 , Issue.1 , pp. 15-40
    • Roes, K.C.B.1    Does, R.J.M.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.