Influence of the substrate on the ion yield in direct laser desorption-ionization for thin organic layers

International Journal of Mass Spectrometry

Volumn 177, Issue 2-3, 1998, Pages 217-223

  Benazouz, M ^b   Hakim, B ^a   Debrun, J L ^a  

^a UNIVERSITÉ D'ORLÉANS   (France)

^b NONE

Author keywords

Laser description thin layers; Time of flight

Indexed keywords

EID: 0042230447     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1387-3806(98)14070-8     Document Type: Article

References (12)

1. G.J.Q. Van Der Peyl, J. Haverkamp, P.G. Kistemaker, Int. J. Mass Spectrom. Ion Phys. 42 (1982) 125.
2. F. Hillenkamp, D. Holtkamp, M. Karas, P. Klüsener, Int. J. Mass Spectrom. Ion Processes 69 (1986) 265.
3. Yunzhi Li, R.T. McIver Jr., J.C. Hemminger, J. Chem. Phys. 93 (1990) 4719.
4. J.P. Speir, I.J. Amster, Anal. Chem. 64 (1992) 1041.
5. Q. Zhan, S.J. Wright, R. Zenobi, J. Am. Soc. Mass Spectrom 8 (1997) 525.
6. B. Schueler, Microsc. Microanal. Microstruct. 3 (1992) 1.
7. At that time: CNRS, Centre d'Etudes et de Recherches par Irradiation, Orleans (France).
8. M. Benazouz et al. (to be published).
9. J.H. Bechtel, J. Appl. Phys. 46 (1974) 1585.
10. C. Girardeau-Montaut, J.P. Girardeau-Montaut, Numerical results of thermal actions induced by high frequency short-pulsed laser trains on metals, in C.W. Draper, P. Mazzoldi, (Eds.), "Laser Surface Treatment of Metals," NATO-ASI Series, E: Applied Science No. 115, 1986, pp. 235-248.
11. J.H. Weaver, C. Krafka, D.W. Lynch, E.E. Koch, Optical Properties of Metals, Vols. 1 and 2, Karlsruhe fach-informations Zentrum, 1981.
12. R. Jeannot, BRGM (Orléans, France), private communication.