Second harmonic generation in the system Ge-As-S ADN analysis of the poling mechanism

Wuli Xuebao/Acta Physica Sinica

Volumn 49, Issue 9, 2000, Pages 1729-1730

  Liu, Qi Ming ^a,b   Zhao, Xiu Jian ^a   Gan, Fu Xi ^b  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

^b SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Electron beam irradiation; Ge As S system glass; Maker fringes; Second harmonic generation; TSDC

Indexed keywords

EID: 0042223570     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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