TEM observations of the initial oxidation stages of Nb-ion-implanted TiAl

Oxidation of Metals

Volumn 58, Issue 3-4, 2002, Pages 375-390

  Taniguchi, Shigeji ^a   Zhu, Yao Can ^b   Fujita, Kazuhisa ^b   Iwamoto, Nobuya ^b  

^a OSAKA UNIVERSITY   (Japan)

^b Ion Eng Res Institute Corporation   (Japan)

Author keywords

Alumina scale; Ion implantation; Niobium; Oxidation; TiAl

Indexed keywords

ELECTRIC POTENTIAL; ION IMPLANTATION; NIOBIUM; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINA SCALE;

TITANIUM COMPOUNDS;

EID: 0042203838     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1020115006816     Document Type: Article

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