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Volumn 94, Issue 3, 1998, Pages 503-508

Study of two-dimensional hole gas at Si/SiGe/Si inverted interface

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042190774 PISSN: 05874246 EISSN: None Source Type: Journal
DOI: 10.12693/APhysPolA.94.503 Document Type: Article

Times cited : (7)

References (11)

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