The influence of deposition conditions and alloying on the electronic properties of amorphous selenium

Semiconductors

Volumn 37, Issue 7, 2003, Pages 789-794

  Kasap, S O ^a   Koughia, K V ^a   Fogal, B ^a   Belev, G ^a   Johanson, R E ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042171621     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1592851     Document Type: Conference Paper

References (19)

1. J. A. Rowlands and S. O. Kasap, Phys. Today, No. 11, 24 (1997).
2. S. O. Kasap and J. A. Rowlands, Proc. IEEE 90, 591 (2002) and references therein.
3. Z. Shukri, B. Polischuk, C. Coia, and H. Rougeot, in Proceedings of 6th International Symposium on the Uses of Selenium and Tellurium, Scottsdale, AZ, 1998 (STDA, Grimbergen, Belgium, 1998), p. 25.
4. S. V. Nemilov and G. T. Petrovskiǐ, Zh. Prikl. Khim. (Leningrad) 36, 932 (1963).
5. S. O. Kasap, in Handbook of Imaging Materials, 2nd ed., Ed. by A. S. Diamond and D. S. Weiss (Marcel Dekker, New York, 2002), Chap. 9 and references therein.
6. M. D. Tabak and W. J. Hillegas, J. Vac. Sci. Technol. 9, 387 (1972).
7. S. O. Kasap and C. Juhasz, Photogr. Sci. Eng. 26, 239 (1982).
8. L. P. Kazakova, E. A. Lebedev, N. B. Zakharova, et al., J. Non-Cryst. Solids 167, 65 (1994).
9. S. O. Kasap, B. Polischuk, and D. Dodds, Rev. Sci. Instrum. 61, 2080 (1990).
10. B. Polischuk and S. O. Kasap, Meas. Sci. Technol. 2, 75 (1991).
11. C. Juhasz, V. Gembala, and S. O. Kasap, J. Mater. Sci.: Mater. Electron. 10, l (1999).
12. V. V. Illarionov and L. M. Lapina, Dokl. Akad. Nauk 114, 1021 (1957).
13. S. O. Kasap, V. Ajyah, B. Polischuk, et al., Phys. Rev. B 43, 6691 (1991).
14. S. O. Kasap, J. Phys. D: Appl. Phys. 25, 83 (1992).
15. S. O. Kasap and B. Polischuk, Can. J. Phys. 73, 96 (1995).
16. C. Juhasz, S. M. Vaezi-Nejad, and S. O. Kasap, J. Imaging Sci. 29, 144 (1985).
17. M. A. Abkowitz, Philos. Mag. Lett. 58, 53 (1988).
18. S. O. Kasap and J. Juhasz, J. Phys. D: Appl. Phys. 18, 703 (1985).
19. D. M. Pai, J. Imaging Sci. Technol. 41, 135 (1997).