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Volumn 77, Issue 3-4, 2003, Pages 379-382
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A new organic complex thin film for ultra-high-density data storage with a scanning tunneling microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
CURRENT VOLTAGE CHARACTERISTICS;
DATA STORAGE EQUIPMENT;
DEPOSITION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
SCANNING TUNNELING MICROSCOPY;
NITROBENZYLIDENE PROPANEDINITRILE;
TETRATHIAFULVALENE;
ULTRAHIGH-DENSITY DATA STORAGE;
VACUUM THERMAL DEPOSITION;
THIN FILMS;
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EID: 0042157294
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-002-1465-x Document Type: Article |
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Times cited : (5)
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References (8)
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