Detection of current-induced vacancies in thin aluminum-copper lines using positrons

Applied Physics Letters

Volumn 68, Issue 3, 1996, Pages 406-408

  Asoka Kumar, P ^a   O'Brien, K ^a   Lynn, K G ^a   Simpson, P J ^b   Rodbell, K P ^c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042146911     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116700     Document Type: Article

References (5)

1. P. J. Simpson, M. T. Umlor, K. G. Lynn, and K. P. Rodbell, Appl. Phys. Lett. AIP 65, 52 (1994).
2. P. J. Schultz and K. G. Lynn, Rev. Mod. Phys. AIP 60, 701 (1988).
3. P. Asoka-Kumar, K. G. Lynn, and D. O. Welch, J. Appl. Phys. AIP 76, 4935 (1994).
4. K. G. Lynn and P. J. Schultz, Appl. Phys. A INS 37, 31 (1985).
5. S. Tanigawa, K. Ito, Y. Otsu, and K. Shima, in Positron Annihilation, edited by P. G. Coleman, S. C. Sharma, and L. M. Diana (North-Holland, Amsterdam, 1982), p. 503.