What's behind good display measurements?

Information Display

Volumn 14, Issue 7, 1998, Pages 18-X

  Kelley, Edward F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042136398     PISSN: 03620972     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. Yoshihiro Ohno, Photometric Calibrations (NIST Special Publication 250-37, U.S. Department of Commerce, National Institute of Standards and Technology, July 1997). Presents the details of how calibrations are made in photometry and describes the subtleties of instrumentation use, with a complete uncertainty analysis.
2. Barry N. Taylor and Chris E. Kuyatt, "Guide-lines for Evaluating and Expressing the Uncertainty of NIST Measurement Results" (NIST Technical Note 1297, 1994 edition). Based on the ISO Guide to the Expression of Uncertainty in Measurement (International Organization for Standardization, 1995).
3. Barry N. Taylor, Guide for the Use of the International System of Units (S1) (NIST Special Publication 811, 1995 edition).
4. CIE Publication No. 69, "Methods of Characterizing Illuminance and Luminance Meters."
5. P. A. Boynton, Y. Ohno, and E. R Kelley, "Interference-Filter Characterization of Spectroradiometers and Colorimeters," SID Intl. Symp. Digest Tech. Papers 27, 207-210 (1996).
6. P. A. Boynton and E. F. Kelley, "Accurate Contrast-Ratio Measurements Using a Cone Mask," SID Intl. Symp. Digest Tech. Papers 28, 823-826 (1997).
7. The discussions on uncertainty and diagnostics in this article are addressed - along with much more - in the Video Electronics Standards Association (VESA) Flat Panel Display Measurements Standard (FPDM) that was scheduled for release in May 1998.