Theoretical calculations of detection limits in total reflection XRF analysis

X-Ray Spectrometry

Volumn 28, Issue 1, 1999, Pages 51-58

  Sánchez, Héctor Jorge ^a  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE;

DETECTION LIMITS; FLUORESCENT INTENSITY; MATRIX; SCATTERED RADIATIONS; THEORETICAL CALCULATIONS; THEORETICAL EXPRESSION; TOTAL REFLECTION; TRACES ELEMENTS; X RAY FLUORESCENCE; XRF ANALYSIS;

TRACE ELEMENTS;

EID: 0042134531     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199901/02)28:1<51::AID-XRS308>3.0.CO;2-O     Document Type: Article

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