Effects of annealing conditions on crystallization of hexagonal manganite films

Ferroelectrics

Volumn 270, Issue , 2002, Pages 99-104

  Suzuki, Kazuyuki ^a   Nishizawa, Kaori ^a   Miki, Takeshi ^a   Kato, Kazumi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

(Y,Yb)MnO3 thin film; Alkoxy derived precursor; c axis orientation; Chemical solution deposition; Composition; Surface morphology

Indexed keywords

ANNEALING; COMPOSITION; CRYSTAL ORIENTATION; CRYSTALLIZATION; MORPHOLOGY; SEMICONDUCTING SILICON; SUBSTRATES; SURFACES;

ALKOXY-DERIVED PRECURSORS; C-AXIS ORIENTATION; CHEMICAL SOLUTION DEPOSITION;

THIN FILMS;

EID: 0042132943     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190211222     Document Type: Conference Paper

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