A lifetime correction method for the gamma-ray yield measurement in (n, xγ) experiments

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 371, Issue 3, 1996, Pages 504-509

  Hongyu, Zhou ^a,b   Guangshun, Huang ^a   Guoying, Fan ^a  

^a BEIJING NORMAL UNIVERSITY   (China)

^b OHIO UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DATA ACQUISITION; DOSIMETRY; FLUORINE; NEUTRON ACTIVATION ANALYSIS; NEUTRON IRRADIATION; NUCLEAR RADIATION SPECTROSCOPY; SILICON;

DECAY GAMMA RAYS; DELAYED GAMMA RAY YIELD; GAMMA RAY PRODUCTION DATA; LIFETIME CORRECTION METHOD; MIXED GAMMA RAY PEAK; NEUTRON ACTIVATION CROSS SECTIONS; TIME OF FLIGHT TECHNIQUE;

GAMMA RAYS;

EID: 0042129902     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01011-4     Document Type: Article

References (5)

1. Zhou Hongyu et al., Chin. J. High Energy Phys. Nucl. Phys. 13 (1989) 173.
2. Zhou Hongyu et al., Chin. J. Nucl. Phys. 12 (1990) 117.
3. J. Csikai et al., Z. Phys. A 325 (1986) 69.
4. G. Singh et al., NASA-TN-D-5946 (1970).
5. B. Mitra et al., Nucl. Phys. 83 (1966) 57.