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Volumn 83, Issue 10, 1998, Pages 5019-5024

Scaling limit of digital circuits due to thermal noise

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0042123349     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367317     Document Type: Article
Times cited : (30)

References (13)
  • 3
    • 0002618205 scopus 로고
    • edited by O. G. Forberth and C. Hackl Oldenbourg, München, and references therein
    • For a review, see R. Landauer, in Der Informationsbegriff in Technik und Wissenschaft, edited by O. G. Forberth and C. Hackl (Oldenbourg, München, 1986), pp. 139-158, and references therein.
    • (1986) Der Informationsbegriff in Technik und Wissenschaft , pp. 139-158
    • Landauer, R.1
  • 11
    • 0004056515 scopus 로고
    • Prentice-Hall, Englewood Cliffs, NJ
    • A. van der Ziel, Noise (Prentice-Hall, Englewood Cliffs, NJ, 1954).
    • (1954) Noise
    • Van Der Ziel, A.1
  • 13
    • 0343975512 scopus 로고    scopus 로고
    • by Semiconductor Industry Association, U.S.A., December 1994 SEMATECH, Inc., Austin
    • The National Technology Roadmap for Semiconductors, 1994 Edition, by Semiconductor Industry Association, U.S.A., December 1994 (SEMATECH, Inc., Austin, 1996).
    • (1996) The National Technology Roadmap for Semiconductors, 1994 Edition


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.